|
|
|
|
| Element percentage | |
| Lead |
46.4
|
| Tin |
53.6
|
CONCLUSION
Overall the results obtained indicate the visual solder quality to be acceptable.
INTRODUCTION (2nd Part)
A sample of recovered solder was submitted for compositional analysis by XRF.
Date submitted: 01/07/97
REPORT
The sample was analysed by XRF against appropriate analytical standards and the results obtained were:
| Cu | 0.03x |
| Sn | 62.6x |
| Au | <0.01x |
CONCLUSION
The recovered solder bar shows tin concentration to be consistent with normal production solder.
The initial work above details SEM/ZAF correction analysis of solder joints which show compositional analysis of microsectioned solder areas by ZAF analysis.
Discrepancies between XRF (bulk analysis) and SEM/ZAF (spot analysis) are believed accounted for from the analysis of sectioned samples which are subject to local concentration gradients across grain boundaries after tin migration during solder reflow.
Derek
Morgan
ADFlex Solutions Ltd
Process Engineering
Dept. 194, Area 26/22
PO BOX 6, Havant, Hampshire
United Kingdom
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